Two techniques for broadband measurement of the surface impedance of high critical temperature superconducting thin films

International Journal of Modern Physics B

Volumn 14, Issue 25-27, 2000, Pages 2926-2931

  Tosoratti, N ^a   Fastampa, R ^a   Giura, M ^a   Lenzi, V ^a   Sarti, S ^a   Silva, E ^b  

^a UNIVERSITÀ DI ROMA LA SAPIENZA   (Italy)

^b ROMA TRE UNIVERSITY   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM OXIDE; COPPER COMPLEX; YTTRIUM;

CONDUCTOR; CONFERENCE PAPER; ELECTRIC CONDUCTIVITY; ELECTROMAGNETIC FIELD; FILM; GEOMETRY; HIGH TEMPERATURE; IMPEDANCE; MEASUREMENT; MICROWAVE RADIATION; REFLECTOMETRY; TECHNIQUE;

EID: 0034735073     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0217979200003113     Document Type: Conference Paper

References (6)