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Volumn 65, Issue 1, 2000, Pages 88-90

Quality tests of electronic noses: The influence of sample dilution and sensor drifts on the pattern recognition for selected case studies

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION; PROCESS CONTROL;

EID: 0034733318     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(99)00312-3     Document Type: Article
Times cited : (12)

References (6)
  • 3
    • 85031569558 scopus 로고    scopus 로고
    • http//www.lennartz-electronic.de.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.