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Volumn 65, Issue 1, 2000, Pages 237-238
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Comparison of the pH sensitivity of different surfaces on tantalum pentoxide
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
ATOMIC FORCE MICROSCOPY;
ELECTROLYTES;
PH;
SURFACE ROUGHNESS;
ELECTROLYTE OXIDE SEMICONDUCTOR (EOS) STRUCTURE;
TANTALUM COMPOUNDS;
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EID: 0034733282
PISSN: 09254005
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-4005(99)00446-3 Document Type: Article |
Times cited : (11)
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References (4)
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