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Volumn 197, Issue 1-3, 2000, Pages 237-242

Electron impact ionization energies

Author keywords

Electron impact; Ionization energies; Photoelectron spectroscopy

Indexed keywords

ACCURACY; ARTICLE; ELECTRON TRANSPORT; GEOMETRY; IONIZATION; MASS SPECTROMETRY; TEMPERATURE MEASUREMENT; THERMAL ANALYSIS;

EID: 0034728290     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/s1387-3806(99)00259-6     Document Type: Article
Times cited : (21)

References (56)
  • 5
    • 0003464216 scopus 로고    scopus 로고
    • NIST Standard Reference Database 69, November National Institute of Standards and Technology, Gaithersburg, MD 20899
    • NIST Chemistry WebBook, NIST Standard Reference Database 69, November 1998, W.G. Mallard, P.J. Lindstrom (Eds.), National Institute of Standards and Technology, Gaithersburg, MD 20899 (http://webbook.nist.gov).
    • (1998) NIST Chemistry WebBook
    • Mallard, W.G.1    Lindstrom, P.J.2
  • 13
    • 10444269371 scopus 로고    scopus 로고
    • private communication
    • J.M. Dyke, private communication, 1999.
    • (1999)
    • Dyke, J.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.