Review of analytical measurements facilitated by drop formation technology

Talanta

Volumn 51, Issue 5, 2000, Pages 921-933

  Miller, Keith E ^a   Synovec, Robert E ^a  

^a Box 35170 Ctr Proc Analyt C   (United States)

Author keywords

Analytical measurements; Chemical analysis; Drop formation

Indexed keywords

MERCURY;

ARTICLE; CHEMICAL ANALYSIS; ELECTROCHEMISTRY; ELECTRODE; EXTRACTION; INSTRUMENTATION; SURFACE TENSION;

EID: 0034724980     PISSN: 00399140     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-9140(99)00358-6     Document Type: Article

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