Tensile drawing induced symmetry in poly(p-phenylene vinylene) films

Journal of Molecular Structure

Volumn 521, Issue 1-3, 2000, Pages 315-323

  Yang, C Y ^a   Lee, K ^b   Heeger, A J ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Pusan National University   (South Korea)

Author keywords

Microstructure; PPV films; Symmetry; X ray diffraction

Indexed keywords

ANISOTROPY; ARTICLE; CHEMICAL STRUCTURE; FILM; GEOMETRY; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 0034724387     PISSN: 00222860     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-2860(99)00450-0     Document Type: Article

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