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Volumn 31, Issue 10-12, 2000, Pages 99-106

A graphical method to repair-cost limit replacement policies with imperfect repair

Author keywords

Imperfect repair; Nonparametric method; Optimal repair cost limit; Replacement policy; Total time on test

Indexed keywords


EID: 0034701846     PISSN: 08957177     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0895-7177(00)00076-5     Document Type: Article
Times cited : (25)

References (12)
  • 2
    • 0016072044 scopus 로고
    • The optimum repair limit replacement policies
    • T. Nakagawa And S. Osaki, The optimum repair limit replacement policies, Operational Research Quarterly 25, 311-317, (1974).
    • (1974) Operational Research Quarterly , vol.25 , pp. 311-317
    • Nakagawa, T.1    Osaki, S.2
  • 4
    • 0020267035 scopus 로고
    • Optimum repair limit policies with a time constraint
    • N. Kaio And S. Osaki, Optimum repair limit policies with a time constraint, International Journal of Systems Science 13, 1345-1350, (1982).
    • (1982) International Journal of Systems Science , vol.13 , pp. 1345-1350
    • Kaio, N.1    Osaki, S.2
  • 6
  • 10
    • 0000844094 scopus 로고
    • On age replacement and the total time on test concept
    • B. Bergman, On age replacement and the total time on test concept. Scandinavian Journal of Statistics 6, 161-168, (1979).
    • (1979) Scandinavian Journal of Statistics , vol.6 , pp. 161-168
    • Bergman, B.1
  • 11
    • 0021432331 scopus 로고
    • The total time on test concept and its use in reliability theory
    • B. Bergman And B. Klefsjö, The total time on test concept and its use in reliability theory, Operations Research 32, 596-607, (1984).
    • (1984) Operations Research , vol.32 , pp. 596-607
    • Bergman, B.1    Klefsjö, B.2
  • 12
    • 0002005187 scopus 로고
    • Total time on test processes and applications to failure data analysis
    • Edited by R.E. Barlow et al., SIAM, Philadelphia
    • R.E. Barlow And R. Campo, Total time on test processes and applications to failure data analysis, in ReliaBility and Fault Tree Analysis, (Edited by R.E. Barlow et al.), pp. 451-481, SIAM, Philadelphia, (1975).
    • (1975) Reliability and Fault Tree Analysis, , pp. 451-481
    • Barlow, R.E.1    Campo, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.