Interferometric measurement of resonance transition wavelengths in C iv, Si iv, Al iii, Al ii, and Si ii

Astrophysical Journal

Volumn 536, Issue 2 PART 2, 2000, Pages

  Griesmann, Ulf ^a,b   Kling, Rainer ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

Author keywords

Atomic data; Methods: Laboratory; Techniques: Spectroscopic

Indexed keywords

EID: 0034690877     PISSN: 0004637X     EISSN: 15384357     Source Type: Journal    
DOI: 10.1086/312741     Document Type: Article

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