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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 23, 2000, Pages 16069-16073

Direct method of surface structure determination by Patterson analysis of correlated thermal diffuse scattering for Si(001)2×1

(4) Abukawa, T a Wei, C M b Yoshimura, K a Kono, S a

a TOHOKU UNIVERSITY (Japan)

b INSTITUTE OF PHYSICS (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ACCURACY; ARTICLE; CHEMICAL BOND; ELECTRON DIFFRACTION; ENERGY; FOURIER ANALYSIS; RADIATION SCATTERING; STRUCTURE ANALYSIS; SURFACE PROPERTY; THREE DIMENSIONAL IMAGING;

EID: 0034670875 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.16069 Document Type: Article

Times cited : (10)

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