Atomic force microscope imaging of molecular aggregation during self-assembled monolayer growth

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 174, Issue 1-2, 2000, Pages 233-243

  Doudevski, Ivo ^a   Hayes, William A ^a   Woodward, John T ^a   Schwartz, Daniel K ^a  

^a Tulane University   (United States)

Author keywords

AFM; Monolayer adsorption; Monolayer growth; Probe microscopy

Indexed keywords

ADSORPTION; AGGLOMERATION; ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; COALESCENCE; FILM GROWTH; FRACTALS; MONOLAYERS; MORPHOLOGY; NUCLEATION; SURFACE ACTIVE AGENTS; WETTING;

MOLECULAR AGGREGATION; SELF ASSEMBLED MONOLAYERS (SAM);

SURFACE PHENOMENA;

ALUMINUM SILICATE; AMPHOPHILE; MICA; OCTADECYL PHOSPHONIC ACID; OCTADECYLTRICHLOROSILANE; OCTADECYLTRIMETHYLAMMONIUM; ORGANIC COMPOUND; PHOSPHONIC ACID DERIVATIVE; SURFACTANT; TETRAHYDROFURAN; UNCLASSIFIED DRUG;

ADSORPTION; ARTICLE; ATOMIC FORCE MICROSCOPY; COVALENT BOND; DESORPTION; DIFFUSION COEFFICIENT; INFRARED SPECTROSCOPY; PRIORITY JOURNAL; SURFACE PROPERTY; WETTABILITY;

EID: 0034670228     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(00)00514-8     Document Type: Article

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