Transport and chemistry at electroactive interfaces studied using line-imaging Raman spectroscopy

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 174, Issue 1-2, 2000, Pages 209-219

  Schwartz, Daniel T ^a   Haight, Scott M ^a  

^a University of Washington   (United States)

Author keywords

Electroactive interfaces; Line imaging Raman spectroscopy; Transport

Indexed keywords

CHEMICAL BONDS; CONDUCTIVE FILMS; COPPER COMPOUNDS; ELECTROLYTES; IONIC CONDUCTION; NICKEL COMPOUNDS; RAMAN SPECTROSCOPY; REDOX REACTIONS; SEMICONDUCTING FILMS; SEMICONDUCTING ORGANIC COMPOUNDS; SURFACE CHEMISTRY; THIN FILMS;

ELECTROACTIVE INTERFACES; LINE IMAGING RAMAN SPECTROSCOPY;

INTERFACES (MATERIALS);

COPPER; COPPER SULFATE; ELECTROLYTE; FERRIC ION; FERROCYANIDE; FERROUS ION; IRON; THIOCYANATE; THIOCYANATE POTASSIUM;

ARTICLE; COLLOID; ELECTROCHEMISTRY; FILM; ION TRANSPORT; OXIDATION; PRIORITY JOURNAL; RAMAN SPECTROMETRY; SEMICONDUCTOR; SURFACE PROPERTY;

EID: 0034670217     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(00)00512-4     Document Type: Article

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