A fast training neural network and its updation for incipient fault detection and diagnosis

Computers and Chemical Engineering

Volumn 24, Issue 2-7, 2000, Pages 431-437

  Rengaswamy, Raghunathan ^a   Venkatasubramanian, Venkat ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

^b Purdue University   (United States)

Author keywords

Bayes classifier; Fault detection and diagnosis; Neural network

Indexed keywords

CHEMICAL OPERATIONS; FAILURE ANALYSIS; NONLINEAR SYSTEMS; OPTIMAL SYSTEMS; REQUIREMENTS ENGINEERING;

BAYES CLASSIFIER; NONLINEAR INPUT OUTPUT MAPS; OPTIMAL PROCESS OPERATIONS;

NEURAL NETWORKS;

ARTIFICIAL NEURAL NETWORK; CALCULATION; CHEMICAL ENGINEERING; CONFERENCE PAPER; MATHEMATICAL ANALYSIS; ONLINE COMPUTER;

EID: 0034661162     PISSN: 00981354     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0098-1354(00)00434-8     Document Type: Conference Paper

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