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Polyhedron

Volumn 19, Issue 3, 2000, Pages 297-305

Time-resolved, in situ X-ray diffraction studies of intercalation in lamellar hosts

(4) O'Hare, D a Evans, J S O a Fogg, A a O'Brien, S a

a UNIVERSITY OF OXFORD (United Kingdom)

Author keywords

In situ X ray diffraction; Intercalation; Layered compounds; Solid state; Synchrotron radiation

Indexed keywords

ACTIVATION ENERGY; BROMINE COMPOUNDS; CHLORINE COMPOUNDS; INTERCALATION; IONS; IV-VI SEMICONDUCTORS; KINETIC THEORY; KINETICS; LITHIUM COMPOUNDS; MANGANESE COMPOUNDS; NIOBIUM COMPOUNDS; SEMICONDUCTING TIN COMPOUNDS; SULFUR COMPOUNDS; TEMPERATURE DISTRIBUTION; X RAY DIFFRACTION;

ENERGY-DISPERSIVE X-RAY DIFFRACTION; GUEST MOLECULES; IN-SITU X-RAY DIFFRACTION; KINETIC STUDY; LAYERED COMPOUND; LAYERED LATTICES; SITU KINETICS; SOLID STATE; TIME-RESOLVED; X-RAY DIFFRACTION STUDIES;

SYNCHROTRON RADIATION;

CATION; CETRIMIDE; COBALTOCENE; DICHALCOGENIDE; DODECYLTRIMETHYLAMMONIUM; HYDROXIDE; LITHIUM; OCTADECYLTRIMETHYLAMMONIUM; SILICATE; SOLVENT; UNCLASSIFIED DRUG;

AQUEOUS SOLUTION; ARTICLE; CHEMICAL REACTION; ENERGY; SOLID STATE; STATISTICAL ANALYSIS; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION;

EID: 0034651473 PISSN: 02775387 EISSN: None Source Type: Journal
DOI: 10.1016/S0277-5387(99)00359-9 Document Type: Article

Times cited : (47)

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