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Volumn 420, Issue 2, 2000, Pages 181-195
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Orthogonal signal correction, wavelet analysis, and multivariate calibration of complicated process fluorescence data
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Author keywords
Multivariate calibration; Orthogonal signal correction; Partial least squares projections to latent structures; Principal component analysis; Process fluorescence data; Wavelet analysis
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Indexed keywords
ARTICLE;
CALIBRATION;
DATA ANALYSIS;
MULTIVARIATE ANALYSIS;
PREDICTION;
PRINCIPAL COMPONENT ANALYSIS;
PRIORITY JOURNAL;
REGRESSION ANALYSIS;
SIGNAL PROCESSING;
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EID: 0034648795
PISSN: 00032670
EISSN: None
Source Type: Journal
DOI: 10.1016/S0003-2670(00)00890-4 Document Type: Article |
Times cited : (84)
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References (29)
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