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Volumn 158, Issue 1, 2000, Pages 263-266

Simulation of X-ray powder diffraction patterns for low-ordered materials

Author keywords

Full profile analysis; Microstrains; Powder X ray diffraction; Real structure; Stacking faults

Indexed keywords

INDIUM; NICKEL;

EID: 0034623154     PISSN: 13811169     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1381-1169(00)00087-X     Document Type: Conference Paper
Times cited : (32)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.