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Volumn 158, Issue 1, 2000, Pages 263-266
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Simulation of X-ray powder diffraction patterns for low-ordered materials
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Author keywords
Full profile analysis; Microstrains; Powder X ray diffraction; Real structure; Stacking faults
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Indexed keywords
INDIUM;
NICKEL;
CATALYSIS;
CONFERENCE PAPER;
CRYSTAL STRUCTURE;
DIFFRACTION;
PROTEIN DOMAIN;
PROTEIN STRUCTURE;
SEQUENCE ANALYSIS;
SIMULATION;
X RAY DIFFRACTION;
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EID: 0034623154
PISSN: 13811169
EISSN: None
Source Type: Journal
DOI: 10.1016/S1381-1169(00)00087-X Document Type: Conference Paper |
Times cited : (32)
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References (5)
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