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Volumn 31, Issue 1, 2000, Pages 15-34

The mathematical and computer modelling of microwave semiconductor devices

Author keywords

HEMT; MESFET; Quantum; Semiconductor; Upwinding

Indexed keywords


EID: 0034602697     PISSN: 08957177     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0895-7177(99)00213-7     Document Type: Article
Times cited : (7)

References (21)
  • 1
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    • Equivalent circuit modelling
    • (Edited by C.M. Snowden and R.E. Miles), Springer-Verlag
    • S. Ieziekiel, Equivalent circuit modelling, In Compound Semiconductor Device Modelling, (Edited by C.M. Snowden and R.E. Miles), pp. 149-169, Springer-Verlag, (1993).
    • (1993) Compound Semiconductor Device Modelling , pp. 149-169
    • Ieziekiel, S.1
  • 2
    • 0008877907 scopus 로고
    • Monte Carlo modelling techniques
    • (Edited by C.M. Snowden), Springer-Verlag
    • M. Al-Mudares, Monte Carlo modelling techniques, In Semiconductor Device Modelling, (Edited by C.M. Snowden), pp. 180-206, Springer-Verlag, (1989).
    • (1989) Semiconductor Device Modelling , pp. 180-206
    • Al-Mudares, M.1
  • 3
    • 0008879920 scopus 로고
    • Monte Carlo models and simulations
    • (Edited by C.M. Snowden and R.E. Miles), Springer-Verlag
    • P. Lugli, Monte Carlo models and simulations, In Compound Semiconductor Device Modelling, (Edited by C.M. Snowden and R.E. Miles), pp. 210-231, Springer-Verlag, (1993).
    • (1993) Compound Semiconductor Device Modelling , pp. 210-231
    • Lugli, P.1
  • 4
    • 0015561910 scopus 로고
    • A 2-dimensional numerical FET model for DC, AC and large signal analysis
    • M. Reiser, A 2-dimensional numerical FET model for DC, AC and large signal analysis, IEEE Trans. Electron Devices ED-20, 35-45, (1973).
    • (1973) IEEE Trans. Electron Devices , vol.ED-20 , pp. 35-45
    • Reiser, M.1
  • 6
    • 0024071891 scopus 로고
    • Simulation of submicrometer GaAs MESFETS using a full dynamic transport model
    • Y.-K. Feng and A. Hintz, Simulation of submicrometer GaAs MESFETS using a full dynamic transport model, IEEE Trans. Electron Devices ED-35, 1419-1431, (1988).
    • (1988) IEEE Trans. Electron Devices , vol.ED-35 , pp. 1419-1431
    • Feng, Y.-K.1    Hintz, A.2
  • 9
    • 0008879921 scopus 로고
    • Numerical methods and their application to device modelling
    • (Edited by C.M. Snowden and R.E. Miles), Springer-Verlag
    • E.A.B. Cole, Numerical methods and their application to device modelling, In Compound Semiconductor Device Modelling, (Edited by C.M. Snowden and R.E. Miles), pp. 1-25, Springer-Verlag, (1993).
    • (1993) Compound Semiconductor Device Modelling , pp. 1-25
    • Cole, E.A.B.1
  • 10
    • 84916389355 scopus 로고
    • Large signal analysis of a silicon Read diode oscillator
    • D.L. Scharfetter and H.K. Gummel, Large signal analysis of a silicon Read diode oscillator, IEEE Trans. Electron Devices ED-16, 64-77, (1969).
    • (1969) IEEE Trans. Electron Devices , vol.ED-16 , pp. 64-77
    • Scharfetter, D.L.1    Gummel, H.K.2
  • 12
    • 0002319588 scopus 로고
    • Classical and semi-classical models
    • (Edited by C.M. Snowden), Springer-Verlag
    • C.M. Snowden, Classical and semi-classical models, In Semiconductor Device Modelling, (Edited by C.M. Snowden), pp. 16-33, Springer-Verlag, (1989).
    • (1989) Semiconductor Device Modelling , pp. 16-33
    • Snowden, C.M.1
  • 16
    • 0023346837 scopus 로고
    • A hybrid central difference scheme for solid state device simulation
    • J.P. Kreskovsky, A hybrid central difference scheme for solid state device simulation, IEEE Trans. Electron Devices ED-34, 1128-1133, (1987).
    • (1987) IEEE Trans. Electron Devices , vol.ED-34 , pp. 1128-1133
    • Kreskovsky, J.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.