Transmission electron microscopy - An indispensable tool for the characterisation of M41S-type materials

Studies in Surface Science and Catalysis

Volumn 129, Issue , 2000, Pages 535-542

  Kooyman, Patricia J ^a   Verhoef, Michel J ^a   Prouzet, Eric ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITÉ DE MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

MCM 41;

ADSORPTION; CONFERENCE PAPER; CRYSTALLIZATION; DENSITY; DESORPTION; PARTICLE SIZE; STRUCTURE ANALYSIS; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION;

EID: 0034590590     PISSN: 01672991     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Article

References (5)

1. J.S. Beck, J.C. Vartuli, W.J. Roth, M.E. Leonowicz, C.T. Kresge, K.D. Schmitt, C.T.W. Chu, D.H. Olson, E.W. Sheppard, S.B. McCullen, J.B. Higgins, J.L. Schlenker, J. Am. Chem. Soc. 114 (1992) 10843.
2. C. Boissière, E. Prouzet, unpublished results.
3. F. Cot, P.J. Kooyman, A. Larbot, E. Prouzet, in: Mesoporous Molecular Sieves 1998, eds. L. Bonneviot, F. Béland, C. Danumah, S. Giasson and S. Kaliaguine, Studies in Surface Science and Catalysis 117 (1998) 231.
4. M.J. Verhoef, P.J. Kooyman, J.A. Peters, H. van Bekkum, Microp. Mesop. Mat. 27 (1999) 365.
5. M.J. Verhoef, P.J. Kooyman, J.C. van der Waal, J.A. Peters, H. Van Bekkum, in preparation.