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Volumn , Issue , 2000, Pages 213-222

Diagnosis of regular structures

Author keywords

[No Author keywords available]

Indexed keywords

CUBE-CONNECTED CYCLES; EFFICIENT DIAGNOSIS ALGORITHM FOR REGULAR STRUCTURES; HYPERCUBES;

EID: 0034590183     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICDSN.2000.857538     Document Type: Conference Paper
Times cited : (8)

References (17)
  • 1
    • 84938017623 scopus 로고
    • On the connection assignment problem of diagnosable systems
    • Dec.
    • F.P. Preparata, G. Metze, and R.T. Chien, "On the Connection Assignment Problem of Diagnosable Systems". IEEE Trans. on Comp., vol. EC-16, pp. 848 - 854, Dec. 1967.
    • (1967) IEEE Trans. on Comp. , vol.EC-16 , pp. 848-854
    • Preparata, F.P.1    Metze, G.2    Chien, R.T.3
  • 2
    • 0016962991 scopus 로고
    • A theory of diagnosability of digital systems
    • June
    • F. Barsi, F. Grandoni, and P. Maestrini, "A theory of diagnosability of digital systems". IEEE Trans. on Comp., vol. C-25, pp. 585 - 593, June 1976.
    • (1976) IEEE Trans. on Comp. , vol.C-25 , pp. 585-593
    • Barsi, F.1    Grandoni, F.2    Maestrini, P.3
  • 3
    • 0019696801 scopus 로고
    • A comparison connection assignment for self-diagnosis of multicomputer systems
    • June
    • J. Maeng and M. Malek, "A Comparison Connection Assignment for Self-Diagnosis of Multicomputer Systems". Proc. FTCS-11, IEEE Comput. Soc. Publ., pp. 173 - 175, June 1981.
    • (1981) Proc. FTCS-11, IEEE Comput. Soc. Publ. , pp. 173-175
    • Maeng, J.1    Malek, M.2
  • 4
    • 84947657515 scopus 로고
    • Characterization of connection assignment of diagnosable systems
    • Jan.
    • S.L. Hakimi and S. L. Amin, "Characterization of Connection Assignment of Diagnosable Systems". IEEE Trans. on Comp., vol. C-23, pp. 86 - 88, Jan. 1974.
    • (1974) IEEE Trans. on Comp. , vol.C-23 , pp. 86-88
    • Hakimi, S.L.1    Amin, S.L.2
  • 5
    • 0021445280 scopus 로고
    • 2.5) fault identification algorithm for diagnosable systems
    • June
    • 2.5) Fault Identification Algorithm for Diagnosable Systems", IEEE Trans. on Comp., vol c-33 n. 6, pp. 486 - 492, June 1984.
    • (1984) IEEE Trans. on Comp. , vol.c-33 , Issue.6 , pp. 486-492
    • Dahbura, A.T.1    Masson, G.M.2
  • 6
    • 0023602622 scopus 로고
    • Almost sure fault tolerance in random graphs
    • December
    • E.R. Scheinerman, "Almost Sure Fault Tolerance in Random Graphs", SIAM J. on Computing, vol. 16 n. 6, pp. 1124 - 1134, December 1987.
    • (1987) SIAM J. on Computing , vol.16 , Issue.6 , pp. 1124-1134
    • Scheinerman, E.R.1
  • 7
    • 0026928212 scopus 로고
    • Efficient diagnosis of multiprocessor system under probabilistic models
    • September
    • D. Blough, G. Sullivan, and G.M. Masson, "Efficient Diagnosis of Multiprocessor System Under Probabilistic Models", IEEE Trans. on Comp., Vol. 41, No. 9, pp. 1126 - 1136, September 1992.
    • (1992) IEEE Trans. on Comp. , vol.41 , Issue.9 , pp. 1126-1136
    • Blough, D.1    Sullivan, G.2    Masson, G.M.3
  • 8
    • 0025383828 scopus 로고
    • Built-in testing of integrated circuit wafers
    • February
    • S. Rangarajan, D. Fussel, and M. Malek, "Built-in Testing of Integrated Circuit Wafers", IEEE Trans. on Comp., vol. 39 n. 2, pp. 195 - 205, February 1990.
    • (1990) IEEE Trans. on Comp. , vol.39 , Issue.2 , pp. 195-205
    • Rangarajan, S.1    Fussel, D.2    Malek, M.3
  • 9
    • 0026888788 scopus 로고
    • Distributed diagnosis algorithm for regular interconnected systems
    • July
    • A. K. Somani and V. K. Agarwal, "Distributed Diagnosis Algorithm for Regular Interconnected Systems", IEEE Trans. on Parallel and Dist. Syst. vol. 41 n. 7, pp. 899 - 906, July 1992.
    • (1992) IEEE Trans. on Parallel and Dist. Syst. , vol.41 , Issue.7 , pp. 899-906
    • Somani, A.K.1    Agarwal, V.K.2
  • 10
    • 0028384114 scopus 로고
    • Almost sure diagnosis of almost every good element
    • March
    • L.E. LaForge, K. Huang, and V.K. Agarwal, "Almost Sure Diagnosis of Almost Every Good Element", IEEE Trans. on Comp., vol. 43 n. 3, pp. 295 - 305, March 1994.
    • (1994) IEEE Trans. on Comp. , vol.43 , Issue.3 , pp. 295-305
    • LaForge, L.E.1    Huang, K.2    Agarwal, V.K.3
  • 11
    • 0029289923 scopus 로고
    • A diagnosis algorithm for constant degree structures and its application to VLSI circuit testing
    • April
    • K. Huang, V.K. Agarwal, L. LaForge, and K. Thulasiraman, "A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing", IEEE Trans. on Parallel and Dist. Syst. vol. 44, n.4, pp.363-372, April 1995.
    • (1995) IEEE Trans. on Parallel and Dist. Syst. , vol.44 , Issue.4 , pp. 363-372
    • Huang, K.1    Agarwal, V.K.2    LaForge, L.3    Thulasiraman, K.4
  • 14
    • 0035481827 scopus 로고    scopus 로고
    • Correct and almost complete diagnosis of processor grids
    • Technical Report IEI B4 - 13-05-99, Istituto di Elaborazione dell'Informazione, Pisa, Italy, May
    • S. Chessa, P. Maestrini, "Correct and Almost Complete Diagnosis of Processor Grids", pp. 30, Technical Report IEI B4 - 13-05-99, Istituto di Elaborazione dell'Informazione, Pisa, Italy, May 1999.
    • (1999) , pp. 30
    • Chessa, S.1    Maestrini, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.