Electrical reliability of two- and four- a-Si:H TFT pixel electrode circuits for active-matrix OLEDs

SID Conference Record of the International Display Research Conference

Volumn , Issue , 2000, Pages 354-357

  He, Yi ^a   Hattori, Reiji ^a   Kanicki, Jerzy ^a  

^a University of Michigan   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; DISPLAY DEVICES; ELECTRODES; HYDROGENATION; LIGHT EMITTING DIODES; SEMICONDUCTING ORGANIC COMPOUNDS; THRESHOLD VOLTAGE;

ELECTRICAL RELIABILITY;

THIN FILM TRANSISTORS;

EID: 0034589197     PISSN: 10831312     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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