Bismuth titanium indium antimony oxide: A low-temperature-coefficient, high-K dielectric material

Journal of Materials Research

Volumn 15, Issue 12, 2000, Pages 2672-2676

  Cava, R J ^a   Krajewski, J J ^a   Qin, Y L ^b   Zandbergen, H W ^b  

^a NOKIA RESEARCH CENTER   (United States)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; COMPOSITION; ELECTRON MICROSCOPY; PERMITTIVITY; POLYCRYSTALLINE MATERIALS; TEMPERATURE MEASUREMENT; X RAY POWDER DIFFRACTION;

POLYCRYSTALLINE CERAMICS;

DIELECTRIC MATERIALS;

EID: 0034582908     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2000.0384     Document Type: Article

References (7)