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Journal of the American Society for Mass Spectrometry

Volumn 11, Issue 4, 2000, Pages 338-344

Electrospray mass spectrometry of semiconductor nanoclusters: Comparative analysis of positive and negative ion mode

(2) Gaumet, Jean Jacques a Strouse, Geoffrey F a

a UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ELECTRIC POTENTIAL; EXTRAPOLATION; IONIZATION; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTOR MATERIALS; THERMODYNAMIC STABILITY;

SEMICONDUCTOR NANOCLUSTERS;

NANOSTRUCTURED MATERIALS;

CHALCONE DERIVATIVE; METAL DERIVATIVE;

MASS SPECTROMETRY;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; IONIZATION; MASS SPECTROMETRY; SEMICONDUCTOR; THERMODYNAMICS;

MASS SPECTROMETRY; METALS; SEMICONDUCTORS;

EID: 0034582508 PISSN: 10440305 EISSN: None Source Type: Journal
DOI: 10.1016/S1044-0305(99)00151-8 Document Type: Article

Times cited : (34)

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