Iterated defect correction for the solution of singular initial value problems

SIAM Journal on Numerical Analysis

Volumn 38, Issue 6, 2001, Pages 1784-1799

  Koch, Othmar ^a   Weinmüller, Ewa B ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Acceleration techniques; Convergence analysis; Implicit Euler rule; Initial value problems; Iterated defect correction; Numerical solution; Ordinary differential equations; Singularity of the first kind

Indexed keywords

EID: 0034580670     PISSN: 00361429     EISSN: None     Source Type: Journal    
DOI: 10.1137/S0036142900368095     Document Type: Article

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