UV reflective modulation using SAWs with high amplitude

Proceedings of the IEEE Ultrasonics Symposium

Volumn 1, Issue , 2000, Pages 655-658

  Schmidt, H ^a   Franke, K ^a   Hoeller, F ^b   Martin, G ^a   Ross Messemer, M ^b  

^a IFW DRESDEN   (Germany)

^b CARL ZEISS SMT AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

REFLECTIVE MODULATION;

ACOUSTIC SURFACE WAVE DEVICES; CALIBRATION; DIFFRACTION; PIEZOELECTRIC MATERIALS; SCANNING ELECTRON MICROSCOPY; SINGLE MODE FIBERS; ULTRAVIOLET RADIATION;

LIGHT MODULATION;

EID: 0034579611     PISSN: 10510117     EISSN: None     Source Type: Journal    
DOI: 10.1109/ULTSYM.2000.922633     Document Type: Article

References (6)

1. Surface acoustic wave technology, macrosuccess through microseisms
2. Controlled diffraction using smart materials
3. The highly sensitive optical measurement of absolute SAW amplitudes for power flow analysis
4. In situ SEM investigations of stress induced migration in SAW structures
5. SAW materials and devices characterization of high resolution and accuracy