X-ray diffraction on spider silk during controlled extrusion under a synchrotron radiation X-ray beam

Biomacromolecules

Volumn 1, Issue 4, 2000, Pages 622-626

  Riekel, Christian ^a   Madsen, Bo ^b   Knight, David ^c   Vollrath, Fritz ^c  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b AARHUS UNIVERSITY   (Denmark)

^c UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

INSECT PROTEIN;

ALGORITHM; ANIMAL; ARTICLE; PHYSIOLOGY; RADIATION EXPOSURE; SCANNING ELECTRON MICROSCOPY; SILK; SPIDER; SYNCHROTRON; TENSILE STRENGTH; X RAY; X RAY CRYSTALLOGRAPHY;

ALGORITHMS; ANIMALS; CRYSTALLOGRAPHY, X-RAY; INSECT PROTEINS; MICROSCOPY, ELECTRON, SCANNING; SILK; SPIDERS; SYNCHROTRONS; TENSILE STRENGTH; X-RAYS;

EID: 0034575301     PISSN: 15257797     EISSN: None     Source Type: Journal    
DOI: 10.1021/bm000047c     Document Type: Article

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