Estimation of the reliability of digital systems implemented on programmable devices

Microelectronics Reliability

Volumn 40, Issue 12, 2000, Pages 2087-2093

  Vasiltsov, Igor V ^a   Mandziy, Bogdan A ^b  

^a TERNOPIL NATIONAL ECONOMIC UNIVERSITY   (Ukraine)

^b LVIV POLYTECHNIC NATIONAL UNIVERSITY   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETISM; MICROPROCESSOR CHIPS; PARAMETER ESTIMATION; SEMICONDUCTOR DEVICE MODELS; SPURIOUS SIGNAL NOISE;

ELECTROMAGNETIC PARASITIC NOISES; FUNCTIONAL RELIABILITY PARAMETERS;

MICROELECTRONICS;

EID: 0034559430     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0026-2714(00)00020-2     Document Type: Article

References (10)

1. MAX+plus II Users Guide. Online access through WWW: http//www.altera.com .
2. Ashenden PJ. The designer's guide to VHDL. The University of Adelaide. San Francisco, CA: Morgan Kaufmann, 1996. p. 688.
3. Mandziy BA, Vasiltsov IV. Evaluation of functional reliability parameters of the digital devices. In: Proceeding of the Sixth International Conference MIXDES'99. 17-19 June, Krakow, Poland. 1999. p. 425-30.
4. Safonov IV. Reliability designing of the operational algorithms. USSR Academy of Sciences, Institute of the automatic and operational process. Vladivostok, 1982. p. 157 [in Russian].
5. Mandziy BA, Vasiltsov IV. Problem of reliability at designing of signals processing digital devices. In: Proceeding of the Third International Conference TELSIKS'97, IEEE. 8-10 October, Nis, Yugoslavia. 1997. p. 245-8.
6. Mandziy BA, Gelyak RI, Kapustiy BO,Vasiltsov IV. The method of the evaluation of the digital devices functional reliability - technics, economics. Automatization of the designing/Russian Scientific and Research Institute of the Interindustry Information, vols. 2-3, 1994. p. 86-92 [in Russian].
7. Mandziy B, Gelyak R, Vasiltsov I. Experimental investigation of the dependence of ATC on external destabilization factors. In: Proceedings of the International S and R Conference, TCSET'98, 23-28 February. Lviv, 1998. p. 24. [in Ukrainian].
8. Fayzulayev BN, Shagurin II, Karmazinskiy AN, et al. High-speed matrix LSI and VLSI - theory and designing. In: M.: radio and communications, 1989. p. 304 [in Russian].
9. Gutzmann M. Modellirung des Simultaneous Switching Noise von MOS-Ausgans Treibern. Facta Universitatis. Ser.: Electron Energet 1997;10(1):75-90 University of Nis.
10. Mandzij B, Vasiltsov I. Simulation of simultaneous switching noise of logic gates in VLSI. In: Proceedings of the Fifteenth Symposium on Electromagnetic Phenomena in Nonlinear Circuits, 22-24 September. Liege, Belgium, 1998. p. 224-6.