Hyperthermal surface ionization in a time-of-flight mass spectrometer

European Journal of Mass Spectrometry

Volumn 6, Issue 4, 2000, Pages 319-323

  Weickhardt, Christian ^a   Draack, Lars ^a   Grotemeyer, Jürgen ^b  

^a BRANDENBURG UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF KIEL   (Germany)

Author keywords

Hyperthermal surface ionization; Pulsed inlet systems; Time of flight mass spectrometers

Indexed keywords

EID: 0034552895     PISSN: 14690667     EISSN: None     Source Type: Journal    
DOI: 10.1255/ejms.344     Document Type: Article

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