LMI-based optimal design of test signals for control-relevant system identification

Proceedings of the American Control Conference

Volumn 5, Issue , 2000, Pages 3224-3228

  Lee, Jay H ^a   Samyudia, Yudi ^a,b  

^a PURDUE UNIVERSITY   (United States)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Control relevant identification; Input test design; Linear matrix inequalities

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; CLOSED LOOP CONTROL SYSTEMS; FEEDBACK; FUNCTION EVALUATION; IDENTIFICATION (CONTROL SYSTEMS); INTEGRAL EQUATIONS; MATRIX ALGEBRA; OPTIMAL CONTROL SYSTEMS; OPTIMIZATION; TRANSFER FUNCTIONS;

CONTROL RELEVANT IDENTIFICATION; INPUT TEST DESIGN; LINEAR MATRIX INEQUALITIES; MEAN SQUARE ERROR; TEST SIGNALS;

CONTROL SYSTEM SYNTHESIS;

EID: 0034548260     PISSN: 07431619     EISSN: None     Source Type: Journal    
DOI: 10.1109/acc.2000.879160     Document Type: Article

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