Degradation of silicone gel by partial discharges due to different defects

IEE Conference Publication

Volumn , Issue 473, 2000, Pages 202-207

  Ebke, T ^a   Khaddour, A ^a   Peier, D ^a  

^a TU DORTMUND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; ELECTROCHEMICAL ELECTRODES; ENCAPSULATION; PARTIAL DISCHARGES; POWER ELECTRONICS;

SILICONE GELS;

SILICONES;

EID: 0034546743     PISSN: 05379989     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1049/cp:20000505     Document Type: Conference Paper

References (10)