Intelligent image correlation using genetic algorithms for measuring surface deformations in the autonomous inspection of structures

Proceedings of the American Control Conference

Volumn 1, Issue , 2000, Pages 460-461

  Mahajan, Ajay ^a   Pilch, Alan ^a   Chu, Tsuchin ^a  

^a SOUTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE CONTROL SYSTEMS; CORRELATION METHODS; IMAGE ANALYSIS; INTELLIGENT CONTROL; INTERPOLATION; OPTIMAL CONTROL SYSTEMS; SURFACE MEASUREMENT; SURFACE STRUCTURE;

AUTONOMOUS INSPECTION; DIGITAL IMAGE CORRELATION TECHNIQUES; INTELLIGENT IMAGE CORRELATION; SPECKLE PATTERNS; SURFACE DEFORMATIONS; SURFACE DISPLACEMENTS;

GENETIC ALGORITHMS;

EID: 0034545490     PISSN: 07431619     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/acc.2000.878942     Document Type: Conference Paper

References (3)