Scalable analytical model for the ESD N-well resistor

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 2000, Pages 437-445

  Puvvada, Venugopal ^a   Srinivasan, Venkatesh ^a   Gupta, Vishal ^a  

^a TEXAS INSTRUMENTS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC DISCHARGES; MATHEMATICAL MODELS; SEMICONDUCTOR QUANTUM WELLS;

ELECTROSTATIC DISCHARGES (ESD); N WELL RESISTORS;

RESISTORS;

EID: 0034543816     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)