TLP measurements for verification of ESD protection device response

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn 24, Issue 2, 2000, Pages 111-120

  Hyatt, H ^a   Harris, J ^b   Alanzo, A ^b   Bellew, P ^c  

^a Hyger Physics Inc ^*  (United States)

^b Littelfuse Ireland Ltd   (United States)

^c Littelfuse Ireland   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRIC EQUIPMENT PROTECTION; ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; ELECTRIC SWITCHES; ELECTROSTATIC DEVICES; RESISTORS; VARISTORS;

ELECTROSTATIC DISCHARGE (ESD); METAL OXIDE VARISTORS (MOV); TIME DOMAIN REFLECTION (TDR); TRANSMISSION LINE PULSER (TLP);

ELECTRIC LINES;

EID: 0034543580     PISSN: 07395159     EISSN: None     Source Type: Journal    
DOI: 10.1109/6104.930959     Document Type: Article

References (15)

1. L. Rector H. Hyatt Polymer composite varistor materials Proc. ANTEC SPE Symp. Proc. ANTEC SPE Symp. 1998-May
2. T. Maloney N. Khurana Transmission line pulsing techniques for circuit modeling of ESD phenomena Proc. EOS/ESD Symp. 49 Proc. EOS/ESD Symp. 1985
3. H. Gieser M. Haunschild Very-fast transmission line pulsing of integrated structures and the charged device model Proc. EOS/ESD Symp. Proc. EOS/ESD Symp. 1996 4126 18727 865129
4. J. Barth J. Richner K. Verhaege TLP calibration, correlation, standards, and new techniques Proc. EOS/ESD Symp. Proc. EOS/ESD Symp. 2000 7140 19230 890031
5. The proposed simulator ESD standard in process Tech. Rep. ESD-S14.0, ESD Association
6. CDM Standard 1999 Tech. Rep. ESD-S5.3.1, ESD Association
7. ESD simulator discharge current verification measurement system requirements 2001 Tech. Rep. ESD-WIP 14.2, EOS/ESD Association WG14
8. J. Barth D. Dale K. Hall D. McCarthy H. Hyatt J. Nuebel D. Smith Measurement of ESD HBM events, simulator radiation and other characteristics toward creating a more repeatable simulation or: simulators should simulate Proc. EOS/ESD Symp. 211 222 Proc. EOS/ESD Symp. 1996 4126 18727 865144
9. Fast Pulse Techniques 1966 E-H Industries
10. H. A. Gieser P. Egger Influence of tester parasitics on ̶charged device model̶̵failure thresholds Proc. EOS/ESD Symp. Proc. EOS/ESD Symp. 1996
11. H. Hyatt J. Harris J. Colby P. Bellew Optimizing the performance of a composite ESD circuit protection device Proc. EOS/ESD Symp. Proc. EOS/ESD Symp. 2000 7140 19230 890025
12. H. Hyatt A real time high voltage calibration method for ESD Proc. EMC'93 Symp. Proc. EMC'93 Symp. Denver CO 1993
13. H. Hyatt H. Calvin H. Mellberg D. Pellinan Measurement of fast transients and application to human ESD Proc. EOS/ESD Symp. Proc. EOS/ESD Symp. San Diego CA 1980-September
14. J. A. Coekin High-Speed Pulse Techniques 1975 Pergamon Press New York
15. C. H. Diaz Automation of electrical overstress characterization for semiconductor devices Hewlett-Packard J. Oct. 1994