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Volumn 5, Issue , 2000, Pages 2239-2241
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Measurement of slow uniform surface displacement with mm/year accuracy
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
INTERFEROMETRY;
SUBSIDENCE;
SYNTHETIC APERTURE RADAR;
INTERFEROGRAM STACKING;
REMOTE SENSING;
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EID: 0034542959
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (34)
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References (4)
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