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Volumn 6, Issue , 2000, Pages 4274-4278
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PI tuning for processes with large dead time
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Author keywords
Frequency response; Model reduction; PI control; Robustness; Sensitivity
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Indexed keywords
FIRST-ORDER PLUS DEAD TIME MODEL;
FREQUENCY RANGES;
HANDLING PROCESS;
MODEL REDUCTION;
PI CONTROL;
SENSITIVITY;
SENSITIVITY SPECIFICATIONS;
SIMULATION EXAMPLE;
FREQUENCY RESPONSE;
ROBUSTNESS (CONTROL SYSTEMS);
FEEDBACK;
MATHEMATICAL MODELS;
NYQUIST DIAGRAMS;
SENSITIVITY ANALYSIS;
CONTROLLERS;
TWO TERM CONTROL SYSTEMS;
MODEL REDUCTION;
NYQUIST PLOT;
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EID: 0034542659
PISSN: 07431619
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ACC.2000.877027 Document Type: Conference Paper |
Times cited : (11)
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References (4)
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