High current characteristics of devices in a 0.18 μm CMOS technology

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 2000, Pages 296-307

  Worley, E ^a   Salem, Ali ^a   Sittampalam, Yoga ^a  

^a Conexant Systems ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC DISCHARGES; FIELD EFFECT TRANSISTORS; RESISTORS; SEMICONDUCTOR DIODES; TRANSIENTS;

ELECTROSTATIC DISCHARGE PROTECTION; HIGH CURRENT CHARACTERISTICS;

CMOS INTEGRATED CIRCUITS;

EID: 0034542548     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)