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Volumn 3, Issue , 2000, Pages 2102-2107

Model for friction in atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CONTINUUM MECHANICS; DAMPING; FRICTION; MATHEMATICAL MODELS; MECHANICAL VARIABLES CONTROL; PIEZOELECTRIC DEVICES;

EID: 0034540487     PISSN: 07431619     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (17)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.