Defects in α-Fe induced by intense-pulsed ion beam (IPIB)

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 171, Issue 4, 2000, Pages 481-486

  Valyaev, A N ^a   Ladysev, V S ^a   Mendygaliev, D R ^a   Pogrebnjak, A D ^b   Valyaev, A A ^c   Pogrebnjak, N A ^d  

^a Technical University   (Kazakhstan)

^b NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^c Technical University   (Russian Federation)

^d PEOPLES FRIENDSHIP UNIVERSITY OF RUSSIA   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BACKSCATTERING; DISLOCATIONS (CRYSTALS); ELECTRON BEAMS; ELECTRON IRRADIATION; ION BEAMS; MICROHARDNESS; POINT DEFECTS; SECONDARY ION MASS SPECTROMETRY; SHOCK WAVES; TRANSMISSION ELECTRON MICROSCOPY;

INTENSE PULSED ION BEAMS (IPIB);

IRON;

EID: 0034540097     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00294-9     Document Type: Article

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