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Volumn , Issue , 2000, Pages 276-286
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Hot carrier degradation and ESD in submicron CMOS technologies: How do they interact?
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC BREAKDOWN OF SOLIDS;
ELECTRIC DISCHARGES;
ELECTRIC FIELDS;
ELECTRON ENERGY LEVELS;
HOT CARRIERS;
MOSFET DEVICES;
TRANSISTORS;
HOT CARRIER DEGRADATION;
CMOS INTEGRATED CIRCUITS;
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EID: 0034539034
PISSN: 07395159
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (5)
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References (47)
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