Electrothermal modeling of ESD diodes in bulk-Si and SOI technologies

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 2000, Pages 430-436

  Wang, Yu ^a   Juliano, Patrick ^a   Joshi, Sopan ^a   Rosenbaum, Elyse ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN; ELECTRIC DISCHARGES; SEMICONDUCTOR DIODES; SILICON ON INSULATOR TECHNOLOGY;

ELECTROSTATIC DISCHARGES (ESD); ELECTROTHERMAL DIODE MODELS;

SEMICONDUCTING SILICON;

EID: 0034538959     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)