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Volumn 172, Issue 11, 2000, Pages 940-945
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Radiation exposure in full-field digital mammography with a flat-panel x-ray detector based on amorphous silicon in comparison with conventional screen-film mammography;Strahlenexposition bei der digitalen Vollfeldmammographie mit einem Flachdetektor aus amorphem Silizium im Vergleich zur konventionellen Film-Folien-Mammographie
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Author keywords
Digital mammography; Flat panel detector; Image quality; Mammography; Radiation exposure
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Indexed keywords
SILICON DERIVATIVE;
ARTICLE;
DIGITAL RADIOGRAPHY;
FEMALE;
HUMAN;
IMAGE QUALITY;
MAMMOGRAPHY;
PHANTOM;
PRACTICE GUIDELINE;
PRIORITY JOURNAL;
RADIATION DETECTION;
RADIATION EXPOSURE;
FEMALE;
HUMANS;
MAMMOGRAPHY;
PHANTOMS, IMAGING;
RADIATION DOSAGE;
SILICON;
X-RAYS;
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EID: 0034534482
PISSN: 09366652
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (18)
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References (22)
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