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Volumn 78, Issue 2, 2000, Pages 203-207
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Sibling differences in cell death of the fission yeast, Schizosaccharomyces pombe, exposed to stress conditions
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Author keywords
Cell age; Fission scars; Fission yeast; Stress; Yeast growth
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Indexed keywords
ARTICLE;
CELL DEATH;
CELL DIVISION;
CELL GROWTH;
CELL SIZE;
CELL STRUCTURE;
CELL WALL;
CONTROLLED STUDY;
FUNGUS CULTURE;
MICROBIOLOGY;
NONHUMAN;
PRIORITY JOURNAL;
SCHIZOSACCHAROMYCES POMBE;
SIBLING;
STEM CELL;
STRESS;
TEMPERATURE;
ADAPTATION, PHYSIOLOGICAL;
CELL DIVISION;
CULTURE MEDIA;
HYDROGEN-ION CONCENTRATION;
SCHIZOSACCHAROMYCES;
TEMPERATURE;
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EID: 0034523744
PISSN: 00036072
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1026556111051 Document Type: Article |
Times cited : (2)
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References (13)
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