Frequently encountered problems in textile wet processing and a diagnostic approach for prevention/solutions

Colourage

Volumn 47, Issue 10, 2000, Pages 57-60

  Sampath, M R ^a  

^a Consultant Qualtek Consultancy ^*  (India)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTOR; INSPECTION; SHEARING; SOFTWARE; WET PROCESSING;

EID: 0034520234     PISSN: 00101826     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (0)