Tool condition monitoring using reflectance of chip surface and neural network

Journal of Intelligent Manufacturing

Volumn 11, Issue 6, 2000, Pages 507-514

  Yeo, S H ^a   Khoo, L P ^a   Neo, S S ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

BACKPROPAGATION; ESTIMATION; MAINTENANCE; NEURAL NETWORKS; REFLECTION; SURFACES; WEAR OF MATERIALS;

CHIP SURFACE; TOOL CONDITION MONITORING;

MACHINE TOOLS;

EID: 0034516536     PISSN: 09565515     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1026583821221     Document Type: Article

References (9)

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