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Volumn 104, Issue 50, 2000, Pages 11837-11841

High-pressure stability in ordered mesoporous silicas: Rigidity and elasticity through nanometer scale arches

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MATERIALS; COMPRESSIBILITY; ELASTIC MODULI; ELASTICITY; HIGH PRESSURE EFFECTS; NANOSTRUCTURED MATERIALS; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; RIGIDITY; SILICA; STRUCTURE (COMPOSITION); SURFACE ACTIVE AGENTS; X RAY DIFFRACTION ANALYSIS;

EID: 0034516186     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp002938k     Document Type: Article
Times cited : (48)

References (35)
  • 9
    • 33646064644 scopus 로고    scopus 로고
    • note
    • The increase in d spacing at high pressure observed in damp samples is assigned to a transition from Bragg scattering from the hexagonal periodicity to diffuse small angle scattering from the characteristic pore + wall size of the partially collapsed composite. For a hexagonal structure, the pore-to-pore distance is 2/√3 times larger than the (100) diffraction peak spacing.
  • 27
  • 32
    • 0030881278 scopus 로고    scopus 로고
    • Lu, Y.; et al. Nature 1997, 389, 364.
    • (1997) Nature , vol.389 , pp. 364
    • Lu, Y.1
  • 33
    • 33646044615 scopus 로고    scopus 로고
    • Ordered Mesoporous Thin Films. U.S. Patent No. 5,858,457, issued January 12
    • Brinker, C. J.; Anderson, M. T.; Ganguli, R.; Lu, Y. Ordered Mesoporous Thin Films. U.S. Patent No. 5,858,457, issued January 12,1999.
    • (1999)
    • Brinker, C.J.1    Anderson, M.T.2    Ganguli, R.3    Lu, Y.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.