Radiation damage and single event effect results for candidate spacecraft electronics

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2000, Pages 106-122

  O'Bryan, Martha V ^a   LaBel, Kenneth A ^a   Reed, Robert A ^a   Howard Jr , James W ^a   Ladbury, Ray I ^a   Barth, Janet L ^a   Kniffin, Scott D ^a   Seidleck, Christina M ^a   Marshall, Paul W ^a   Marshall, Cheryl J ^a   Kim, Hak S ^a   Hawkins, Donald K ^a   Sanders, Anthony B ^a   Carts, Martin A ^a   Forney, James D ^a   et al , ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAVY IONS; PROTONS; RADIATION DAMAGE; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR DEVICES; SPACE APPLICATIONS;

SINGLE EVENT EFFECT; SPACECRAFT ELECTRONICS;

RADIATION EFFECTS;

EID: 0034514988     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (19)