On-wafer determination of intrinsic spontaneous spectrum of vertical cavity surface-emitting devices

Electronics Letters

Volumn 36, Issue 25, 2000, Pages 2106-2108

  Royo, P ^a   Stanley, R P ^a   Ilegems, M ^a   Streubel, K ^a   Gulden, K H ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; EMISSION SPECTROSCOPY;

VERTICAL CAVITY SURFACE-EMITTING LASERS (VCSEL);

SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0034513235     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20001462     Document Type: Article

References (4)

1. COLDREN, L.A., and CORZINE, S.W.: 'Diode lasers and photonic integrated circuits' (John Wiley & Sons, New York, 1995)
2. SCHUBERT, E.F., WANG, Y.H., CHO, A.Y., TU, L.W., and ZYDZIK, G.J.: 'Resonant cavity light-emitting diode', Appl. Phys. Lett., 1992, 60, pp. 921-923
3. BENISTY, H., MAYER, M., and STANLEY, R.P.: 'A method of source terms for dipole emission modification in modes of arbitrary planar structures', J. Opt. Soc. Am. A, 1998, 15, pp. 1192-1201
4. STREUBEL, K., HELIN, U., OSKARSSON, V., BÄCKLlN, E., and JOHANSSON, Å.: 'High brightness visible (660nm) resonant-cavity light-emitting diode', IEEE Photonics Technol. Lett., 1998, 10, pp. 1685-1687