SEU evaluation of SRAM memories for space applications

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2000, Pages 61-63

  Scheick, L Z ^a   Swift, G M ^a   Guertin, S M ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVIONICS; ELECTRONIC EQUIPMENT TESTING; HEAVY IONS; ION BOMBARDMENT; SEMICONDUCTOR STORAGE; SPACE APPLICATIONS; STATIC RANDOM ACCESS STORAGE;

COMMERCIAL-OFF-THE-SHELF; DEVICE UNDER TEST; SINGLE EVENT EFFECTS; SINGLE EVENT UPSET;

RADIATION DAMAGE;

EID: 0034512958     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (6)