Experimental valuation of net atomic charge via XPS

Surface and Interface Analysis

Volumn 29, Issue 12, 2000, Pages 851-855

  Meda, L ^a   Nicastro, C ^a   Conte, F ^a   Cerofolini, G F ^b  

^a Istituto Guido Donegani SpA   (Italy)

^b STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; BINDING ENERGY; ELECTRON ENERGY LEVELS; SILICATES; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC CHARGES; CHEMICAL SHIFTS; ELECTROSTATIC EQUATIONS;

ELECTRIC CHARGE;

EID: 0034512933     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200012)29:12<851::AID-SIA939>3.0.CO;2-Y     Document Type: Article

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