The number of good reflections in a powder pattern

Journal of Applied Crystallography

Volumn 33, Issue 5, 2000, Pages 1295-1301

  Sivia, D S ^a  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTAL; DATA ANALYSIS; DIFFRACTION; MATHEMATICAL MODEL; THEORY;

EID: 0034512006     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800009250     Document Type: Article

References (8)

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2. David, W. I. F., Ibberson, R. M. & Mathewman, J. C. (1992). Report RAL-92-032. Rutherford Appleton Laboratory, Oxford, England.
3. David, W. I. F. (1999). J. Appl. Cryst. 32, 654-663.
4. Gull, S. F. (1989). Maximum Entropy and Bayesian Methods, edited by J. Skilling, pp. 53-71. Dordrecht: Kluwer.
5. Pawley, G. S. (1981). J. Appl. Cryst. 14, 357-361.
6. Sivia, D. S. (1996). Data Analysis: a Bayesian Tutorial. Oxford University Press.
7. Sivia, D. S. & David, W. I. F. (1994). Acta Cryst. A50, 703-714.
8. Sivia, D. S. & Rawlings, S. G. (1999). Foundations of Science Mathematics, Oxford Chemistry Primers, No. 77. Oxford University Press.