Surface defect detection with histogram-based texture features

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4197, Issue , 2000, Pages 140-145

  Iivarinen, Jukka ^a  

^a AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE; FEATURE EXTRACTION; IMAGE ANALYSIS; IMAGE SEGMENTATION;

HISTOGRAMS; SURFACE DEFECT DETECTIONS; TEXTURE SEGMENTATIONS;

COMPUTER VISION;

EID: 0034511683     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.403757     Document Type: Conference Paper

References (23)