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Volumn 83, Issue 12, 2000, Pages 52-64

Field analysis in a lossy dielectric sandwiched between a flanged rectangular waveguide and a conducting plane

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LOSSES; DIELECTRIC MATERIALS; ELECTROMAGNETIC FIELD MEASUREMENT; ELECTROMAGNETIC WAVE PROPAGATION; PERMITTIVITY; RECTANGULAR WAVEGUIDES; SPECTRUM ANALYSIS;

EID: 0034511527     PISSN: 8756663X     EISSN: None     Source Type: Journal    
DOI: 10.1002/1520-6432(200012)83:12<52::AID-ECJB6>3.0.CO;2-L     Document Type: Article
Times cited : (1)

References (7)
  • 2
    • 85040012322 scopus 로고
    • Surface impedance of absorbing material coating conducting plane
    • in Japanese
    • Yoshitomi K. Surface impedance of absorbing material coating conducting plane. EMT-92-29, 1992. (in Japanese)
    • (1992) EMT-92-29
    • Yoshitomi, K.1
  • 3
    • 0342742461 scopus 로고
    • Nondestructive measurements
    • Nikkei Technology Library; (in Japanese)
    • Nishikata A. Nondestructive measurements. In: Absorption and shield for electromagnetic fields. Nikkei Technology Library; 1989. p 527-529. (in Japanese)
    • (1989) Absorption and Shield for Electromagnetic Fields , pp. 527-529
    • Nishikata, A.1
  • 4
    • 0343176907 scopus 로고    scopus 로고
    • Measurement of complex permittivity by using a flanged rectangular waveguide
    • in Japanese
    • Hirano M, Takahashi M, Abe M. Measurement of complex permittivity by using a flanged rectangular waveguide. EMT-98-70, 1998. (in Japanese)
    • (1998) EMT-98-70
    • Hirano, M.1    Takahashi, M.2    Abe, M.3
  • 5
    • 0343612413 scopus 로고    scopus 로고
    • Measurement of complex permittivity by using a flanged rectangular waveguide: Higher order mode numbers needed to calculate dominant mode reflection coefficient
    • in Japanese
    • Hirano M, Takahashi M, Abe M. Measurement of complex permittivity by using a flanged rectangular waveguide: Higher order mode numbers needed to calculate dominant mode reflection coefficient. IEICE Conference Papers, C-2-58, 1998. (in Japanese)
    • (1998) IEICE Conference Papers, C-2-58
    • Hirano, M.1    Takahashi, M.2    Abe, M.3
  • 6
    • 0343612410 scopus 로고
    • Spectral domain approach
    • Yamashita E (editor). Basic methods for the analysis of electromagnetic wave problems. (in Japanese)
    • Itoh T. Spectral domain approach. In: Yamashita E (editor). Basic methods for the analysis of electromagnetic wave problems. IEICE; 1991. (in Japanese)
    • (1991) IEICE
    • Itoh, T.1
  • 7
    • 0342742458 scopus 로고
    • Electromagnetic waves
    • in Japanese
    • Sekiguchi T. Electromagnetic waves. Asakura Shoten; 1977. p 85-97. (in Japanese)
    • (1977) Asakura Shoten , pp. 85-97
    • Sekiguchi, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.